1. ......................
Author: Singh, Narinder
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Very large scale integration - Testing - Data processing ، Integrated circuits,، Expert systems )Computer science(,، Artificial intelligence
Classification :
TK
7874
.
S533
1987
2. An artificial intelligence approach to test generation
Author: Singh, Narinder
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing , Expert systems )Computer science( , Artificial intelligence
Classification :
TK
7874
.
S533
3. An artificial intelligence approach to test generation
Author: Singh, Narinder, 6591-
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Integrated circuits -- Very large scale integration -- Testing -- Data processing,، Expert systems )Computer science(,، Artificial intelligence
Classification :
TK
7874
.
S533
4. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
5. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
1986
6. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
1986
7. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
8. An artificial intelligence approach to test generation
Author: by Narinder Singh
Library: Central Library and Document Center of Shahid Madani University of Azarbayjan (East Azarbaijan)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (computer science),Artificial intelligence
Classification :
TK
,
7874
,.
S533
,
1987
9. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
1986
10. An artificial intelligence approach to test generation
Author: Singh, Narinder, 6591-
Library: Library of Niroo Research Institue (Tehran)
Subject: ، Integrated circuits- Very large scale integration- Testing- Data processing,، Expert systems )Computer science(,، Artificial intelligence
Classification :
TK
7874
.
S533
1987
